P. I. Akimov
The Lenin's All-Russian Electrotechnical Institute, Moscow, Russia

   The problems of secondary emission influence in powerful electron-beam devices, such as electron-beam switches (EBS) are considered. The mathematical model of a secondary emission is offered, is authentic taking into account characteristic for the secondary emission singularities of real materials, and algorithms of its realization in the programs of numerical projection of electron-optical systems (EOS) of electron-beam devices. The examples of the analysis EOS EBS are reduced in view of secondary emission influence.

Contents