APPLIED PHYSICS

THE SCIENTIFIC AND TECHNICAL JOURNAL


No. 4 Founded in 1994 Moscow 2003


Low-frequency noise spectra of high quality MCT photoconductors

M. S. Nikitin, G. V. Chekanova
Federal State Unitary Enterprise ALPHA, Moscow, Russia

   Low-frequency flicker-noise 1/f spectra were examined on Photoconductive Mercury-Cadmium Telluride (PC MCT) infrared radiation detectors. Noise measurements were carried out on PC MCT detectors with peak wavelength lp from 3,0 to 5,5 mm and from 10,5 to 12,5 mm at operating temperature Top@205—210 K and Top @ 78 K respectively. High quality PC MCTs show extremely low spectral density of excess noise 1/f and low values of noise-knee frequency from 10 to 150 Hz. Tested PC MCTs demonstrate high-level performance.

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