Microbolometer matrix's interrogation mode relationships with NETD at the sensitive element's Nyquist and temperature noises predominance
Yu. M. Eskin
ORION Federal R&P Association, Moscow, Russia
The relationships between uncooled microbolometer matrix-based thermal imager's noise equivalent temperature difference and thermal energy dissipated in the sensitive element during the interrogation time values are discussed at microbolometer's Nyquist and temperature noises predominance. This dissipated energy is linked, by the mean of matrix operation mode, with the sensitive element resistance allowed values interval, and, hence its fabricating technology features. Four types of uncooled microbolometer matrix design are under consideration: element-by-element current read-out circuit; row-by-row current read-out circuit with column integrators; element-by-element voltage divider read-out circuit, and row-by-row voltage divider read-out circuit with column integrators.
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