The analysis of discharging a dielectric irradiated by an electron beam involving thermoelectret effect
E. A. Grachev, N. N. Negulyaev
Physical Department, Moscow State University of M. V. Lomonosov,
Moscow, Russia
S. I. Zaitsev
Institute of Microelectronic Technology, Russian Academy of Science,
Chernogolovka, Moscow region, Russia
In this paper the influence of thermoelectret effect on a process of charge relaxation in a dielectric layer irradiated by an electron beam is considered. It is shown, that this effect can essentially influence on a process of dielectric discharging. The experimental method, which allows to determine the importance of thermoelectret effect during a discharging of irradiated dielectric materials, is presented.
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