APPLIED PHYSICS

THE SCIENTIFIC AND TECHNICAL JOURNAL


No. 5 Founded in 1994 Moscow 2004


Focalizing superconducting system for the MIS-1 electron beam source of multiply charged ions

V. G. Abdulmanov, P. D. Vobly, V. F. Kulikov, V. M. Syrovatin, A. V. Utkin
Budker Institute for Nuclear Physics, Novosibirsk, Russia

   For the electron beam source of multiple charged ions the focalizing superconducting magnet system have been designed. It is mated with an electron-optical system on an axis. The magnet system creates a focusing field of 3 Tl along an axis of a drift structure of the ion sourse.

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