APPLIED PHYSICS

THE SCIENTIFIC AND TECHNICAL JOURNAL


No. 6 Founded in 1994 Moscow 2008


IR-images of InAsSbP flip-chip LEDs in the 3 mm spectral range

A. L. Zakhgeim, N. V. Zotova, N. D. Il’inskaya, S. A. Karandashev, B. A. Matveev, M. A. Remennyi, N. M. Stus’, A. A. Usikova, A. E. Chernyakov
Ioffe Physico-Technical Institute, St.-Petersburg, Russia

   We present and analyze IR images of p-InAsSbP/n—InAsSbP/n+—InAs flip-chip LEDs obtained with and without external lightening (l = 2.9 mm) including those measured at a reverse and forward bias onto a p-n-junction. Evaluation of the ohmic contact reflectivity and relation between con-tact and bulk resistance has also been made.

PACS: 85.60.-q

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