Applied physics
No. 2-3, 1997

Ion sources for technological ion-plasma equipment

A.P. Eremin, V.D. Smoljaninov, A.M. Filachev
Research Institute for Electron and Ion Optics, Moscow, Russia

   Analysis of tendency development of ion-beam sources for technological ion-plasma equipment and their application was done. In this particle describes characteristics of ion sources, which was work out in the institute, presents physical principles, lying in the base of them work.

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