A. A. Baykov's Institute of Metallurgy RAS, Moscow, Russia

In this paper it is elaborated the methodology of the multifractal characteristic's calculation of the images of investigated structures. The image is scanned by means of scanner or digital camera and -is transferred into PC as BMP-file in Greyscale. After that by change of the current palette interactively it is matched the grey level threshold and image is converted into the bilivel format. Binary image of current structure, derived from this file, is imaged as two-dimensional array and is modeled by set of the interpenetrated fractal subsets. This subsets characterize initial set as multifractal by means of two come - f(α) and D(q).