Applied physics
N 1, 2003

Testing of readout integrated circuits

D. V. Borodin, U. V. Osipov, N. A. Shushkevich
JSC "RTC Impex", Moscow, Russia

A. A. Lopuhin
State Unitary Enterprise «RD&P Centre "Orion"», Moscow, Russia

   For testing of integrated circuits of the matrix multiplexer it is offered to use a photocurrent generated by external light of a visible band in p-n-transition a source — substrate of the input trs of a cell. The examples of testing of matrix multiplexers of the 128x128 format with number of detective cells less than 0.1 % are submitted.

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