Applied physics
N 2, 2003

Electron diffraction study of PbSnTe-PbTe heterostructures grown by MBE

A. I. Dirochka, A. S. Kononov, P. S. Serebrennikov, N. A. Suleimanov
ORION Research-and-Production Association, Moscow, Russia

   In the work are studied structural, electrical and optical properties of film heterojunctions pPb1-xSnxTe-nPbTe obtained by condensation of molecular beams in vacuum ~10^-6 mm mercury pressure. It is determined that diffusion fringes intensity on diffraction patterns are different depending on thickness of films (d) and temperature of films growing (T_f). The intensity of diffussion fringes also depends on survey temperature (T_s). The correlation between intensity of diffusion fringes on electron diffraction patterns and photosensitivity of heterojunctions Pb1-xSnxTe-PbTe is found.

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