Measurement of channels resistance of microchannel plates
A. A. Khatukhov, O. G. Ashkhotov
Kabardino-Balkarian state university, Nalchik, Russia
The resistance of boundary and internal channels of MCP are measured. High volume and surface conductivity result in strong electrical connection of the next channels. It does not allow making detailed diagnostics of the separate channel in MCP structure. The increase of time of hydrogen gas bake reduces resistance for all MCP areas. The increase of duration of heating in nitrogen environment stimulates return process. The various behaviour of boundary and internal channels is established both at hydrogen gas bake, and at heating in nitrogen environment.
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