Application of I—V precise graphs for IR-photoconductors characterization Part I. The development of the method of I—V graphs precise measurements
L. I. Diakonov, V. V. Probylov
The Federal State United Enterprise "Alpha", Moscow, Russia
The simple and precise method of I—V curve measurement is developed. The method suit for IR-photoconductors (IRPC) characterization. It allows to obtain quickly the I—V table with the accuracy up to 0.01 % from more than 40 separate values. The data of the table are treated in a PC for: (a) data correction, (b) deriving R = f (V) dependence and (c) calculation of power dissipated by photoconductor. The R = f (V) graphs fit better then I—V dependences for the characterization of IRPC properties on ageing, after heat treatment and on manufacturing technology changes.
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