No. 1 | Founded in 1994 | Moscow 2008 |
Veklenko B. A. Fliker noise and boson peak as a one and the same phenomenon | 5 | |
Kharitonov A. S. Structural properties of a macromolecule in the thermostat | 13 | |
Grushko N. S., Potanakhina L. N. Temperature depen-dence of average length of a jump in the InGaN/GaN structures | 17 | |
Filachev A. M., Saginov L. D., Kononov A. S., Sviridov A. N., Bakumenko V. L. Filtering device on the basis of optical detail with positive and negative by derivative of relations of anglеs of full internal reflection to a wave-length | 20 | |
Boltar K. O., Yakovleva N. I., Kashuba A. S., Udalova A. G IR transmittance spectra of MCT epitaxial layers | 26 | |
Askerov K. A., Gadzhieva V. I. T Influence of ionized radiation on anisotropy of electric properties of indium selenide | 31 |
Marchenko V. A. Vanadium oxide films for uncoo- led microbolometers produced by reactive magnetron sput-tering | 35 | |
Zinovyev O. A., Neumyvakin L. V. Development of a decontamination method using the integral action of plasma beam discharge on microorganisms’ cells | 39 |
Gurovich B. A., Prikhodko K. E., Kuleshova E. A., Domantovsky A. G., Maslakov K. I. Emitting and magnetic properties of the pseudo-single domain micro and nanopatterned magnetic media | 44 |
Dem'yanenko M. A., Ovsyuk V. N. Improved method for equalization temperature-induced non-uniformities in microbolometer FPA response | 54 | |
Solyakov V. N., Zhegalov S. I., Saginov L. D., Filachev A. M., Boltar K. O., Burlakov I. D., Sviridov A. N. FPA nonuniformity correction method based on signals from observed scene | 60 | |
Akimov V. M., Vasileva L. A., Kagan N. B., Klimanov E. A., Kjurbet I. U., Liseykin V. P., Michertuneynz A. R., Sednev M. V., Seregina N. N., Shuckin S. V. Methods creations contact metallization with In bump to silicon matrix MOS multiplexers | 71 | |
Ismayilov N. D., Guseyinov E. K., Gasanov I. S., Geyidarov S. A. P-n-junctions on the basis of Hg1-xCdxTe received with an irradiation by low-energy ions of indium and argon | 74 | |
Arakelov G. A. Some non-standard applications of thermoelectric coolers in photodetectors | 77 | |
Novoselov A. R., Klimenko A. G., Vasiliev V. V. Application of pulsed UV laser for dicing of arrays and linear of photodiodes based on MCT solid solution | 79 | |
Asheulov A. A., Dobrovolsky Yu. G., Romanyuk I. S., Foty V. D. Transitional contacts of branches of TEM promoted durability on the basis of crystals of the hard solutions Bі-Te-Se-Sb | 85 | |
Antipova M. A., Bochkov V. D., Davydov S. E., Kazarova Yu. A. Technological aspects of assembling the photoelectronic array modules on basis of lead chalcogenide with application of polymeric materials | 89 | |
Avetisyan G. H., Borodin D. V., Osipov Yu. V. CMOS multiplexer with analogue TDI mode for hybrid FPA | 92 | |
Vasilyev V. V., Mashukov Yu. P. Histeresis of the capacitance-voltage characteristics of p-Cd0.27Hg0.73Te structures with wide graded gap layer on the surface | 96 |
Aleev R. M., Nasibullin R. A Comparison variants of scanning in thermal imager 2-nd generations | 102 | |
Gerasjuk A. K., Goev A. I., Grinberg E. E., Potelov V. V., Senik B. N., Suhachev A. B., Nozdrachev A. V. The research of the technology factors, which are influenced on the quality thin films dioxide of silicon with the purpose of increasing exploitation's characteristics of optical assemblies and which are made by a method of deep optical contact | 106 | |
Bekhtin Yu. S., Barantsev A. A., Bryantsev A. A., Saginov L. D., Solyakov V. N., Medvedev A. S. Algorithms of digital processing the IR images without calibration on geometrical noise | 110 |