Dependence of composition of intrinsic oxide grown CdxHg1-xTe monocrystal surface on a crystal surface orientation was studied. One layers at a time analysis of the anode oxide composition made by ESXA method showed that for (111) and (100) surfaces an oxide composition changes smoothy from a substrate to a surface of the oxide layers. An interlayer of a non-oxidized tellurium was found on (110) in the oxide. Connection of discovered effects with physical and chemical features of crystal surfaces is discussed.