APPLIED PHYSICS

THE SCIENTIFIC AND TECHNICAL JOURNAL


No. 5 Founded in 1994 Moscow 2003


Computerized diagnostic equipment for ion beam parameters measurements

I. N. Kanel, A. N. Nosirev, P. A. Tsygankov
Bauman Moscow State Technical University, Moscow, Russia

   Computerized diagnostic equipment for ion beam parameters measurements is presented. Its components and algorithm of function are described. The results of analysis of ion beams from different types of ion sources for technological application are presented.

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