| Filachev A.M.
Problems of Theoretical and Applied Electron and Ion Optics
| | 5 |
| Bykovsky V.F., Meshkov I.N., Selesnev I.A., Syresin E.M.
Experiments with electron beam injection in ionosphere plasma and rare gas
| | 7 |
| Il’in V.P.
Parallel algorithms of modeling the high current EOS | | 14 |
| Andreev S.V., Monastyrsky M.A., Tarasov V.A., Schlev M.Ya., Greenfield D.E.
Formation of sub-femtosecond photoelectron bunches in time-dependent electric fields
| | 20 |
| Greenfield D.E., Monastyrsky M.A., Tarasov V.A. . A grid photocathode free of the first-order temporal chromatic aberration
| | 32 |
| Bublyaev R.A., Galeev G.A., Baranova L.A.
Studying focusing and space-time features of the new type 3-d electrostatic lenses
| | 39 |
| Ovcyannikova L.P., Fishkova T.Ya
Influence of cylindrical pole sizes to parameters of high-dispersion mass-analyzer with in-homogeneous field
| | 42 |
| Golikov Yu.K., Krasnova N.K., Solovjev K.V., Grigorjev D.V.
On analytical relation between axisymmetric and two-dimension Laplace’s fields
| | 48 |
| Sveshnikov V.M.
Calculation of cathode area in electron-optical systems forming the intensive beams of charged particles
| | 50 |
| Sveshnikov V.M.
Increasing of the accuracy of the intensive charged particle beams calculation
| | 55 |
| Petrovich O.N., Stekolnikov A.F.
Simulation of influence of the electrode structure parameters and emitting plasma parameters on the characteristics of narrow electron beam
| | 65 |
| BimurzaevS.B.,Yakushev E.M.
Method of a parametrization for the precise electron trajectories
| | 73 |
| Eremin A.P., Smolyaninov V.D., Kozlov A.N., Uvaev A.G., Filachev A.M.
Electron-ion-plasma production equipment for manufacture of workpieces of microphotoelectronics and precise machine industry
| | 77 |
| Kryuchkov V.G., Potelov V.V., Senik D.N.
Vacuum aspherization of high-precise optical elements of IR facilities
| | 85 |
| Borisov A.M., Borodulina N.V., Krit B.I., Tikhonov S.A.
Speciality of ion implantation use vacuum-arc ion source
| | 89 |
| Fatyanova G.I., Kulikov Yu.V.,Vasichev B.N.
Forming the light-section 100-eV electron beams in a raster-type
electron microscope
| | 93 |
| Perevodchikov V.I., Shapenko V.N., Stalkov P.M., Murashov A.S.
Development of electron gates with diminished mass-dimensional parameters
| | 97 |
| Krivosheev P.V., Manuilov V.N.
Influence of electric field allocation in the area of an electrostatic mirror on bombardment of the cathode by reflected electrons in gyrotrons
| | 101 |
| Balebanov V.M., Erokhin N.S., Mikhailovskaya L.A.
Energy spectrum estimates for the ion-electron emission in the radioisotope battery
| | 105 |
| Gagarin Yu.E., Stepovich M.A.
Some possibilities of the use of confluence analisis for an interval parameter estimation of semiconductors in cathodoluminescent microscope
| | 109 |
| Zhukov A.A., Zhukov S.A., Tchetverov Yu.S., Babaevsky P.G., Shapoval S.Yu.
Polyimide coatings texture development by ECR-plasma etching
| | 113 |
| Borisov S.S., Grachev E.A., Negulyaev N.N., Cheremukhin E.A., Zaitsev S.I.
Modeling the
dielectric polarization during an electron beam exposure
| | 118 |
| Golikov Yu.K., Grigorjev D.V., Krasnova N.K., Solovjev K.V.
Generalization of the variables separation method in axisymmetric potential theory
| | 124 |
Contents of
the journal down to 1997