Filachev A. M.
The Seventh All-Russian Seminar “Problems of Theoretical and Applied Electron
and Ion Optics”
| | 25 |
Boltushkin E. V., Bykovsky V. F., Kobets A. G., Korotaev Yu. V., Lokhmatov V. I., Malakhov V. N., Meshkov I. N., Pivin R. V., Rudakov A. Yu., Selez-
nev I. A., Sidorin A. O., Smirnov A. V., Trubnikov G. V., Yakovenko S. L.
Dynamics of charged particles in a magnetic field of the stellatron type
| | 27 |
Kozlov A. N., Gaidoukova I. S., Uvaev A. G., Scherbakov A. B., Filachev A. M.
Vacuum technological equipment for microphotoelectronic production
| | 32 |
Kozlov A. N., Greenfield D. E., Scherbakov A. V., Filachev A. M.
Automated control of technological parameters of vacuum equipment to guarantee unbreakable quality check
| | 38 |
Kozlov A. N., Zaitsev A. I., Danilovskiy A. E., Filachev A. M.
Design of cold-cathode ion sources for precise electron-beam processing of the semiconductor structures
| | 45 |
Sveshnikov V. M.
About calculation of intensive charged particle by the iterative
method on subdomains without intersection
| | 49 |
Greenfield D. E.
Finite-element simulation of thermoemission electron guns
| | 57 |
Greenfield D. E., Monastyrskiy M. A., Tarasov V. A.
Perturbation techniques in the problems of computational charged particle optics
| | 64 |
Kagan N. B., Liberova G. V., Yakunin S. N.
Bridge structure control microbolometer array using electron probe
| | 75 |
Golikov Yu. K., Krasnova N. K., Solovyev K. V., Elokhin V. A., Nikolayev V. I.
Stability zones of quadrupole mass srectrometer in longitudinal magnetic field
| | 78 |
Belkin V. M., Zavjalov M. A., Syvoroy V. A., Chikchachev A. S.
Adequacy of spherical diode theory
| | 80 |
Borovikov P. V., Grigoriev V. Yu.
Simulation of plasma-filled TWT characteristics
| | 84 |
Ovsyannikova L. P., Fishkova T. Ya., Surkov V. A.
Drawing out system of an ion source with beam deflection to an input of single-pole mass-analyzer 88
| | 88 |
Goev A. I., Poletov V. V., Privalenko V. N., Senik B. N., Tikhonravov A. V.,
Cherednichenco O. B.
Problematic matters of adaptation of technological vacuum equipment for
setting current and promising tasks when making optical components
| | 92 |
Bogomolova L. D., Nemov A. S., Borodulina N. V., Borisov A. M., Kozlov D. A., Tsyganov D. I.
Study of carbon films, received with the help of a vacuum — arc ion source with the graphitic cathode 94
| | 94 |
Zhuravleva V. D., Semenov S. O.
Complex of codes for 3D electron-optic systems calculation
| | 97 |
Borisov S. S., Grachev E. A., Bloshenko A., Misyutina T., Zayitsev S. I.
Definition of parameters of subsurface structures for a sample through an energy distribution of secondary electrons
| | 102 |
Larionov A. V.
Confined flow multiple beam shaping at the powerful klystron for the semiconductive linear electron-positron colliders
| | 105 |
Arhipov D. A., Ilyina E. M., Kudryashov V. P., Rogosin V. I., Usov V. N.
High-perveance electron guns for powerful broadband low-voltage grid-controlled TWT
| | 109 |
Melnik I. V.
Modelling a geometry of high-voltage glow discharge electrode systems forming the profile electron beams
| | 112 |
Zaitsev N. I., Ilyakov E. V., Kulagin I. S., Manuilov V. N.
В. Н.
Influence of electrons reflected from magnetic mirror on formation of electron beam in relativistic gyrotron
| | 121 |
Dreomova N. N.
Simple technique for determination of structure and dimensional parameters of layered system
| | 126 |
Gagarin Yu. E., Khomutski V. А., Snachev А. V., Dvoryanchikova Yu. V., Stepovich M. A.
About the possibility of interval identification of functional dependences at research of semiconductor materials in a cathodoluminescent microscopy 128
| | 128 |